The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2020
Filed:
Oct. 31, 2019
Xilinx, Inc., San Jose, CA (US);
XILINX, INC., San Jose, CA (US);
Abstract
A method for testing on-die capacitors is provided. The method comprises transmitting, during a first time period, a first modulated testing signal from a first transmitter port of a transmitter to a first receiver port of a receiver along a first path of a differential signal, the first receiver port connected to a first on-die capacitor in the receiver along the first path; driving, during the first time period, a constant voltage on a second transmitter port of the transmitter to a second receiver port of the receiver along a second path of the differential signal comprising a second on-die capacitor; and determining whether the first on-die capacitor is functional, based on the first modulated testing signal.