The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10862346 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 08, 2020

Filed:

Mar. 16, 2018
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Fei Chen, Shanghai, CN;

Gang Li, Shanghai, CN;

Ping Zhao, Shanghai, CN;

Assignee:

NXP B.V., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02J 50/60 (2016.01); H02J 7/02 (2016.01); H02J 50/80 (2016.01); H02J 50/10 (2016.01); H02J 50/12 (2016.01);
U.S. Cl.
CPC ...
H02J 50/60 (2016.02); H02J 7/025 (2013.01); H02J 50/80 (2016.02); H02J 50/10 (2016.02); H02J 50/12 (2016.02);
Abstract

In a wireless charging system, a power-transmitting node (TX), has a processor, a memory, a power transmitter for transmitting power wirelessly to a power-receiving node (RX), and a signal receiver for receiving signals from the RX. After the processor detects the presence of a foreign object (FO) during a power-transfer session, the processor places the TX in a protection state. The processor detects whether the FO has been removed using quality factor (QF) values for the TX that the processor measures before and after detecting the presence of the FO, and without requiring any QF values calibrated off-line. The QF values include a QF value measured before the FO is present, a QF value measured just after the TX enters the protection state, and a current QF value that is repeatedly updated as long as the TX remains in the protection state.


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