The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Nov. 14, 2016
Applicant:

Philips Ip Ventures B.v., Eindhoven, NL;

Inventors:

David W. Baarman, Fennville, MI (US);

Joshua K. Schwannecke, Grand Rapids, MI (US);

Neil W. Kuyvenhoven, Ada, MI (US);

Esai E. Umenei, Grand Rapids, MI (US);

Dale R. Liff, Kent, OH (US);

Andrew C. Zeik, Hudson, OH (US);

Mark A. Blaha, Twinsburg, OH (US);

Jason L. Amistadi, Lyndhurst, OH (US);

Robert D. Gruich, Copley, OH (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 21/00 (2006.01); G01V 3/02 (2006.01); H02J 50/12 (2016.01); H02J 50/60 (2016.01); H02J 7/02 (2016.01); H02J 5/00 (2016.01); H01F 38/14 (2006.01);
U.S. Cl.
CPC ...
H02J 50/12 (2016.02); G01R 21/00 (2013.01); G01V 3/02 (2013.01); H01F 38/14 (2013.01); H02J 5/005 (2013.01); H02J 7/025 (2013.01); H02J 50/60 (2016.02);
Abstract

A system and method of controlling inductive power transfer in an inductive power transfer system with power accounting. Parasitic metal in proximity to the primary unit can be more accurately detected by accounting for changes in known power losses during operation. The amount of power loss during inductive power supply transfer in an inductive power supply system can vary depending on the alignment of the primary unit and the secondary device. The amount of power loss during inductive power supply transfer can also vary as a function of changes in the operating frequency of the switching circuit in the primary unit or as a function of changes in the secondary device load.


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