The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Aug. 29, 2018
Applicant:

Nichia Corporation, Anan, JP;

Inventor:

Tomokazu Taji, Anan, JP;

Assignee:

NICHIA CORPORATION, Anan, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 5/40 (2006.01); H01S 5/00 (2006.01); H01S 5/30 (2006.01); H01S 5/022 (2006.01); G01R 31/44 (2020.01); G01R 31/26 (2020.01);
U.S. Cl.
CPC ...
H01S 5/4018 (2013.01); G01R 31/2601 (2013.01); G01R 31/2635 (2013.01); G01R 31/44 (2013.01); H01S 5/005 (2013.01); H01S 5/0014 (2013.01); H01S 5/02272 (2013.01); H01S 5/02292 (2013.01); H01S 5/02296 (2013.01); H01S 5/3013 (2013.01); H01S 5/0071 (2013.01); H01S 5/02208 (2013.01); H01S 5/02248 (2013.01); H01S 5/02276 (2013.01); H01S 5/4031 (2013.01);
Abstract

A method of manufacturing a light emitting device includes: providing a light emitting device in which a first and second semiconductor laser elements are connected in series; performing a first measurement that includes supplying current to the first semiconductor laser element to measure at least one property of the first semiconductor laser element, and supplying current to the second semiconductor laser element to measure at least one property of the second semiconductor laser element; supplying current to the first and second semiconductor laser elements for a length of time; performing a second measurement that includes supplying current to the first semiconductor laser element to measure the at least one property of the first semiconductor laser element, and supplying current to the second semiconductor laser element to measure the at least one property of the second semiconductor laser element, and evaluating the first and second semiconductor laser elements.


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