The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Apr. 24, 2018
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

James L'Heureux, Santa Clara, CA (US);

Ryan T. Downey, San Jose, CA (US);

David Muquing Hou, Cupertino, CA (US);

Yan Rozenzon, San Carlos, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); B01D 53/32 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32844 (2013.01); B01D 53/32 (2013.01); H01J 37/32862 (2013.01); H01J 37/32889 (2013.01); H01L 21/67017 (2013.01); H01L 21/67109 (2013.01); B01D 2257/204 (2013.01); B01D 2257/55 (2013.01); B01D 2258/0216 (2013.01); B01D 2259/818 (2013.01); H01J 2237/002 (2013.01);
Abstract

Embodiments disclosed herein include an abatement system for abating compounds produced in semiconductor processes. The abatement system includes an exhaust cooling apparatus located downstream of a plasma source. The exhaust cooling apparatus includes a plate and a cooling plate disposed downstream of the plate. During operation, materials collected on the plate react with cleaning radicals to form a gas. The temperature of the plate is higher than the temperature of the cooling plate in order to improve the reaction rate of the reaction of the cleaning radicals and the materials on the plate.


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