The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2020
Filed:
May. 06, 2016
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Takashi Azuma, Tokyo, JP;
Kenji Mashio, Tokyo, JP;
Takae Yamashita, Tokyo, JP;
Susumu Shiizuka, Tokyo, JP;
Junichi Nishitani, Tokyo, JP;
Masafumi Utsumi, Tokyo, JP;
Jun Shibuya, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
An abnormality diagnosis system for diagnosing an abnormality event in an atomic power generation plant on the basis of an abnormality indication detection result from an abnormality indication monitoring system is provided with an abnormality diagnosis control unit which acquires a parameter transition in a monitoring period from a non-detection timing to an indication detection timing, and a parameter contribution in the monitoring period and a database. The abnormality diagnosis control unit executes a matching determination between the parameter transition and parameter contribution that have been acquired from the abnormality indication monitoring system, and a parameter transition for determination and a parameter contribution for determination that have been stored in the database, and identifies an abnormality event and an abnormality indication facility that are associated with the parameter transition and parameter contribution determined to be matching.