The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Jun. 04, 2018
Applicant:

Maxell Holdings, Ltd., Kyoto, JP;

Inventors:

Shinji Kawakami, Kyoto, JP;

Toshio Kawakita, Kyoto, JP;

Masao Fujita, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/39 (2006.01); G11B 5/70 (2006.01); G11B 5/706 (2006.01); G11B 5/82 (2006.01); G11B 5/714 (2006.01); G11B 5/68 (2006.01);
U.S. Cl.
CPC ...
G11B 5/3909 (2013.01); G11B 5/68 (2013.01); G11B 5/70 (2013.01); G11B 5/70642 (2013.01); G11B 5/714 (2013.01); G11B 5/82 (2013.01);
Abstract

A refractive index nL and an attenuation rate kL of a magnetic layer are obtained by irradiating linearly polarized light at an irradiation angle of 70° from a lengthwise direction of the magnetic layer to the surface of the magnetic layer, and a vertical reflectance RL during vertical incidence of the linearly polarized light in the lengthwise direction is obtained based on nL and kL. A refractive index nT and an attenuation rate kT of the magnetic layer are obtained by irradiating linearly polarized light at an irradiation angle of 70° from a width direction of the magnetic layer to the surface of the magnetic layer, and a vertical reflectance RT during vertical incidence of the linearly polarized light in the width direction is obtained from nT and kT. If a variation rate A (%) of RL and RT is A=|RL/RT−1|×100, the relationship A≤10% is established.


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