The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

May. 22, 2019
Applicant:

Tencent Technology (Shenzhen) Company Limited, Shenzhen, CN;

Inventor:

Honghao Wang, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/10 (2006.01); G06T 17/30 (2006.01);
U.S. Cl.
CPC ...
G06T 17/30 (2013.01); G06T 17/10 (2013.01);
Abstract

A curved surface model generation method and apparatus in a three-dimensional (3D) scenario are provided. The method includes obtaining a curved surface parameter inputted for a to-be-generated curved surface model; and obtaining two-dimensional coordinates of a plurality of sampling points. A first dimensional direction of each sampling point is a direction of a chord corresponding to an arc at a radial cross section of the curved surface model. A second dimensional direction is a curved-surface width direction of the curved surface model. The method also includes determining, for each sampling point, a coordinate value of the sampling point in a third dimensional direction based on the curved surface parameter, the third dimensional direction being perpendicular to the first dimensional direction and the second dimensional direction; and generating the curved surface model based on coordinate values of each sampling point in the first, second, and third dimensional directions.


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