The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2020
Filed:
Mar. 18, 2020
Continuse Biometrics Ltd., Tel Aviv, IL;
Zeev Zalevsky, Rosh HaAyin, IL;
Javier Garcia, Valencia, ES;
CONTINUSE BIOMETRICS LTD., Tel Aviv, IL;
Abstract
A system for monitoring parameters of a sample includes an imaging unit including a lens assembly and a detector unit configured for collecting light arriving from a region of interest on an object while being defocused with respect to the region of interest and generating defocused image data pieces indicative of light collected from the region of interest. The lens assembly includes at least one lens and is configured for defining at least one intermediate optical plane being a conjugate image plane or an intermediate Fourier plane with respect to an image plane of the detector unit. The system includes at least one symmetry replicator located at the at least one intermediate optical plane, thereby providing imaging of secondary speckle pattern on the detector array having a selected symmetry condition.