The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2020
Filed:
Feb. 08, 2020
Applicant:
Siemens Healthcare Gmbh, Erlangen, DE;
Inventors:
Philipp Bernhardt, Forchheim, DE;
Boris Stowasser, Erlangen, DE;
Assignee:
Siemens Healthcare GmbH, Erlangen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06T 7/00 (2017.01); G16H 30/40 (2018.01); G06N 20/00 (2019.01); G01N 23/04 (2018.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); A61B 6/4291 (2013.01); A61B 6/4441 (2013.01); A61B 6/4458 (2013.01); G01N 23/04 (2013.01); G06N 20/00 (2019.01); G16H 30/40 (2018.01); G06T 2207/10116 (2013.01); G06T 2207/20081 (2013.01);
Abstract
A method for training a function of an X-ray system that has a positioning mechanism such as a C-arm, a detector, and, in a beam path in front of the detector, an anti-scatter grid. Positioning of the detector at a large number of different positions occurs. The positioning mechanism is deflected and/or distorted. Recording of at least one X-ray photograph in each of the positions then takes place, and the method further includes machine learning of artifacts generated by the anti-scatter grid from all X-ray photographs for the function.