The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Feb. 10, 2020
Applicant:

Bertec Corporation, Columbus, OH (US);

Inventors:

Necip Berme, Worthington, OH (US);

Jaswandi Tushar Pitale, Plain City, OH (US);

Assignee:

Bertec Corporation, Columbus, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/147 (2006.01); G06K 9/00 (2006.01); G02B 27/01 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00348 (2013.01); G02B 27/0172 (2013.01); G02B 27/0179 (2013.01); G02B 2027/014 (2013.01);
Abstract

A measurement system includes at least one measurement assembly having at least one measurement device, a head-mounted visual display device having an output screen, and a data processing device operatively coupled to the at least one measurement assembly and the head-mounted visual display device. The data processing device is configured to generate one or more graphical representations of measurement output data for superimposition onto a visual representation of the system user and/or an object being manipulated by the system user, and display the superimposed measurement output data on the head-mounted visual display device so that the system user is able to visualize the superimposed measurement output data when wearing the head-mounted visual display device, and adjust his or her movements based upon feedback from the superimposed measurement output data. The one or more graphical representations of the measurement output data being determined from the at least one measurement assembly.


Find Patent Forward Citations

Loading…