The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Oct. 21, 2014
Applicant:

Korea Atomic Energy Research Institute, Daejeon, KR;

Inventors:

Dong Jun Hyun, Daejeon, KR;

Byung Seon Choi, Daejeon, KR;

Kwan Seong Jeong, Sejong, KR;

Jong Hwan Lee, Daejeon, KR;

Ik June Kim, Daejeon, KR;

Geun Ho Kim, Daejeon, KR;

Jei Kwon Moon, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/17 (2020.01); G05B 19/4097 (2006.01); G05B 19/4069 (2006.01); G06F 30/00 (2020.01);
U.S. Cl.
CPC ...
G06F 30/17 (2020.01); G05B 19/4069 (2013.01); G05B 19/4097 (2013.01); G06F 30/00 (2020.01); G05B 2219/35009 (2013.01); G05B 2219/35097 (2013.01); G05B 2219/35123 (2013.01); G05B 2219/45044 (2013.01);
Abstract

The present invention relates to a cutting process simulation method and a system thereof which can efficiently optimize the decommissioning process of a nuclear facility, thereby saving costs and time and ensuring safety in the decommissioning process. The cutting process simulation system, according to one embodiment of the present invention, may comprise: a display unit: and a control unit which cuts a cutting target in a nuclear facility by using a design program, displays the cut shape on the display unit, and predicts the amount of secondary waste generated in the process of cutting the cutting target.


Find Patent Forward Citations

Hyun, Dong. (2020). Cutting process simulation method and system thereof (U.S. Patent No. 10860751). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10860751

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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