The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Nov. 14, 2018
Applicant:

Korea University Research and Business Foundation, Seoul, KR;

Inventors:

Chuck Yoo, Seoul, KR;

Young Pil Kim, Siheung-si, KR;

See Hwan Yoo, Yongin-si, KR;

Kyoung Woon Lee, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 21/46 (2013.01); G06F 3/0488 (2013.01); G06F 21/36 (2013.01);
U.S. Cl.
CPC ...
G06F 21/46 (2013.01); G06F 3/04883 (2013.01); G06F 21/36 (2013.01); G06F 2221/2149 (2013.01);
Abstract

An apparatus and a method for measuring the security strength of a lock pattern applied to a terminal device are disclosed. The disclosed apparatus may include: a CCI monitoring part configured to read cache coherence information associated with a touch made over a multiple number of points implementing a lock pattern inputted by a user from a CCI (cache coherence interconnect); a computation part configured to compute a multiple number of similar lock pattern candidates by using the read cache coherence information; and a measurement part configured to measure the security strength of the inputted lock pattern by using the multiple number of similar lock pattern candidates.


Find Patent Forward Citations

Yoo, Chuck. (2020). Apparatus and method for measuring security strength of lock pattern applied to multi-core based terminal device (U.S. Patent No. 10860708). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10860708

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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