The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Apr. 30, 2019
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Leron Fliess, Kiryat Ono, IL;

Nimrod Shani, Raanana, IL;

Ronen Gazit, Tel Aviv, IL;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 12/0804 (2016.01);
U.S. Cl.
CPC ...
G06F 12/0804 (2013.01); G06F 2212/1021 (2013.01); G06F 2212/262 (2013.01); G06F 2212/608 (2013.01);
Abstract

A technique handles metadata corruption to avoid data unavailability. The technique involves performing metadata evaluation operations on metadata describing pages of written data in a data-log that holds data en route to volumes in secondary storage. The technique further involves, while results of the metadata evaluation operations indicate that there is no corrupt metadata, flushing the pages of written data from the data-log to the volumes in the secondary storage. The technique further involves, in response to a result of a particular metadata evaluation operation indicating that metadata for a particular page of written data in the data-log is corrupt, quarantining the particular page of written data from the data-log to a containment cache to enable further flushing of other pages of written data from the data-log to the volumes in the secondary storage.


Find Patent Forward Citations

Loading…