The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2020
Filed:
Dec. 23, 2014
Applicant:
Hewlett Packard Enterprise Development Lp, Houston, TX (US);
Inventors:
Assignee:
MICRO FOCUS LLC, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 11/26 (2006.01); G06F 16/00 (2019.01); G06F 11/263 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/263 (2013.01); G06F 11/2635 (2013.01); G06F 16/00 (2019.01); G06F 17/18 (2013.01);
Abstract
Example implementations relate to automatically rerunning test executions. Some implementations may capture data during executions of a test. The data may include test status data, test rerun data, test owner data, and/or code committer data. Some implementations may also dynamically determine, for a failed execution of the test, a number of reruns to execute based on the captured data. Additionally, some implementations may cause in response to the dynamic determination, automatic rerun executions of the test until one of the rerun executions passes, the rerun executions being performed up to the number of times.