The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Jan. 31, 2020
Applicant:

Fmr Llc, Boston, MA (US);

Inventors:

Bhanu Prashanthi Murthy, Bangalore, IN;

Sajith Kumar Vadakaraveedu, Bangalore, IN;

Prashanth Bottangada Machaiah, Bangalore, IN;

Aanchal Gupta, Bangalore, IN;

M. Karthik Kumar, Siruseri, IN;

Assignee:

FMR LLC, Boston, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06K 9/62 (2006.01); G06F 16/17 (2019.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3075 (2013.01); G06F 11/076 (2013.01); G06F 11/3006 (2013.01); G06F 11/3068 (2013.01); G06F 16/1734 (2019.01); G06K 9/6257 (2013.01); G06K 9/6278 (2013.01);
Abstract

Systems and methods for predicting computing system issues include: receiving a set of incident management tickets for a set of computing system issues and a set of computer log files for multiple modules of the computing system; arranging the set of tickets into chronologically ordered groups associated with particular computing system issues; pre-processing the set of computer log files to remove specified information, append to each log entry an indicator of the module of the log file, and merge the log entries; determining for each group a set of patterns for the group's associated computing system issue before the group's associated computing system issue arises; calculating for each pattern in each group a similarity score; selecting a subset of patterns whose similarity scores exceed a specified threshold; and generating a computing model associating the subset of patterns in each group with the group's associated computing system issue.


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