The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2020
Filed:
Mar. 28, 2018
Futurewei Technologies, Inc., Plano, TX (US);
Haopeng Liu, Beijing, CN;
Xu Wang, Beijing, CN;
Guangpu Li, Chicago, IL (US);
Shan Lu, Chicago, IL (US);
Feng Ye, Mississauga, CA;
Chen Tian, Union City, CA (US);
Shen Chi Chen, San Jose, CA (US);
Futurewei Technologies, Inc., Plano, TX (US);
Abstract
A method implemented by a network element (NE) in a distributed system, the method comprising tracing an execution of a program in the distributed system to produce a record of the execution of the program, wherein the record indicates states of shared resources at various times during the execution of the program, identifying a vulnerable operation that occurred during the program execution based on the record, wherein the record indicates that a first shared resource of the shared resources is in a flawed state after a node that caused the first shared resource to be in the flawed state crashed, and determining that the vulnerable operation results in a time of fault (TOF) bug based on performing a fault-tolerance mechanism.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile