The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Jul. 31, 2018
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Karun Thankachan, Cochin, IN;

Prajnan Goswami, Guwahati, IN;

Mohammad Rafey, Bangalore, IN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 9/448 (2018.01);
U.S. Cl.
CPC ...
G06F 11/006 (2013.01); G06F 9/4498 (2018.02); G06F 2201/805 (2013.01); G06F 2201/865 (2013.01);
Abstract

A method is used in monitoring an application in a computing environment. The method represents execution of the application on a system as a finite state machine. The finite state machine depicts at least one state of the application, where the state indicates at least one of successful application execution and unsuccessful application execution. The method identifies an error state within the finite state machine, where the error state indicates the unsuccessful application execution. The method identifies, by analyzing the finite state machine, a non-error state as a cause of the unsuccessful application execution, where the unsuccessful application execution is represented as a path comprising a plurality of states, where the path comprises the non-error state. The method maps the non-error state to a location in the application to identify the cause of the unsuccessful application execution.


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