The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2020
Filed:
Nov. 10, 2016
Omron Corporation, Kyoto, JP;
Minoru Oka, Moriyama, JP;
OMRON Corporation, Kyoto, JP;
Abstract
Provided is a management system for performing quality management on manufacturing equipment. A management system that includes: an acquisition component that acquires state information for manufacturing equipment that is subject to management; a determination component that, on the basis of the acquired state information, determines whether an event has occurred; a display component that displays both an image that schematically or realistically represents a manufacturing line included in the manufacturing equipment and, separated into the four perspectives Machine, Man, Material, and Method, indexes that indicate the likelihood that there is a factor that caused an event; and an output component that, when a specific event has occurred, outputs, in response to a user selection, analysis results for each of one or more factors belonging to each of the four perspectives, the analysis results indicating a likelihood of having caused the specific event that occurred.