The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Dec. 11, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

James Austin Besley, Killara, AU;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G06T 5/50 (2006.01); G06T 3/40 (2006.01); G02B 21/06 (2006.01); G02B 27/10 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 21/06 (2013.01); G02B 21/361 (2013.01); G02B 27/1066 (2013.01); G06T 3/4076 (2013.01); G06T 5/50 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/20221 (2013.01);
Abstract

A system for forming an image () of a substantially translucent specimen () has an illuminator () configured to variably illuminate the specimen from a plurality of angles of illumination such that (a) when each angle () at a given point on the specimen is mapped to a point () on a plane () perpendicular to an optical axis (), the points on the plane have an increasing density (e.g. FIGS.C,E,C,E,A,A,C,E,A,C,E) towards an axial position on the plane; or (b) the illumination angles are arranged with a substantially regular pattern in a polar coordinate system (FIG.A,B) defined by a radial coordinate that depends on the magnitude of the distance from an optical axis and an angular coordinate corresponding to the orientation of the angle relative to the optical axis. A detector is configured to acquire a plurality of variably illuminated, relatively lower-resolution intensity images () of the specimen based on light emitted from the illuminator according to variable illumination and filtered by an optical element (). A processor is arranged to computationally reconstruct a relatively higher-resolution image of the specimen by iteratively updating overlapping regions () of the relatively higher-resolution image in Fourier space (FIG.B) with the variably-illuminated, lower-resolution intensity images.


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