The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

May. 10, 2016
Applicant:

Mitsubishi Electric Corporation, Chiyoda-ku, JP;

Inventors:

Tomoaki Takewa, Chiyoda-ku, JP;

Wataru Tsujita, Chiyoda-ku, JP;

Yoshitsugu Sawa, Chiyoda-ku, JP;

Kenji Kataoka, Chiyoda-ku, JP;

Tadashi Yamamoto, Chiyoda-ku, JP;

Seiya Nagashima, Chiyoda-ku, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 19/23 (2010.01); G01S 19/36 (2010.01); G01S 19/24 (2010.01); H04B 17/29 (2015.01);
U.S. Cl.
CPC ...
G01S 19/23 (2013.01); G01S 19/243 (2013.01); G01S 19/36 (2013.01); H04B 17/29 (2015.01);
Abstract

A test signal generator generates a first test signal. A test signal transmitter transmits the first test signal. An RF receiver unit receives the first test signal and a first satellite signal through a receiving antenna, and generates a second test signal and a second satellite signal, respectively. Each of first and second demodulators calculates a correlation value between the second satellite signal and the spreading code to acquire a satellite. A first failure detector unit compares a signal intensity of the second test signal with a threshold to generate a first failure detection signal. A second failure detector compares the satellites acquired by the first and second demodulator to generate a second failure detection signal. A state determiner determines whether and where a failure exists, using the first and second failure detection signals.


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