The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Jan. 04, 2018
Applicant:

Valeo Schalter Und Sensoren Gmbh, Bietigheim-Bissingen, DE;

Inventors:

Ho Hoai Duc Nguyen, Bietigheim-Bissingen, DE;

Peter Horvath, Bietigheim-Bissingen, DE;

Assignee:

Valeo Schalter und Sensoren GmbH, Bietigheim-Bissingen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/931 (2020.01); G02B 26/10 (2006.01); G01S 7/484 (2006.01); G01S 7/486 (2020.01);
U.S. Cl.
CPC ...
G01S 17/931 (2020.01); G02B 26/10 (2013.01); G01S 7/484 (2013.01); G01S 7/486 (2013.01);
Abstract

The invention relates to an optical element () for an emitting unit () of an optical acquisition device (), wherein the optical element () comprises a first side () having a reflective first free-form surface (F) and a second side (), which is opposite to the first side (), having a refractive second free-form surface (F). Furthermore, the optical element () is designed to transmit a beam bundle () incident on the second side () on the optical element () at least in large part through the second free-form surface (F) up to the first free-form surface (F), to reflect the beam bundle () transmitted through the second free-form surface (F) up to the first free-form surface (F) at the first free-form surface (F), and to emit the beam bundle () reflected from the first free-form surface (F) via the second free-form surface (F). In this case, the first free-form surface (F) is designed to increase a divergence of the beam bundle () incident on the first free-form surface (F), and the second free-form surface (F) is designed, upon emission of the beam bundle () reflected from the first free-form surface (F), to reduce the divergence increased during the reflection.


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