The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2020
Filed:
Nov. 15, 2017
Applicant:
Silicon Motion, Inc., Jhubei, TW;
Inventors:
Hung-Sen Kuo, Zhubei, TW;
Te-Wei Chen, Zhubei, TW;
Hung-Sheng Chang, Hsinchu, TW;
Ming-Wan Kuan, Toufen, TW;
Assignee:
SILICON MOTION, INC., Jhubei, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/319 (2006.01); G01R 31/3183 (2006.01); G01R 31/28 (2006.01); G01R 31/30 (2006.01); G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31924 (2013.01); G01R 31/2879 (2013.01); G01R 31/3177 (2013.01); G01R 31/318314 (2013.01); G01R 31/3008 (2013.01);
Abstract
A circuit test method for a test device to test a device under test is provided. The circuit test method includes the steps of applying zero volts to a plurality of power pins of the device under test; applying a test voltage to a first signal pin among a plurality of signal pins of the device under test; and measuring a current on a second signal pin among the plurality of signal pins of the device under test and determining whether there is a leakage current in the device under test.