The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2020
Filed:
Apr. 03, 2018
Kabushiki Kaisha Nihon Micronics, Tokyo, JP;
Takayuki Hayashizaki, Aomori, JP;
Hisao Narita, Aomori, JP;
Kabushiki Kaisha Nihon Micronics, Musashino, JP;
Abstract
An electrical connection device includes: a probe (); and a probe head () including a top portion () allowing penetration of the probe (), a bottom portion () disposed closer to a distal end portion than the top portion () and allowing penetration of the probe (), and an upper guide portion () and a lower guide portion (), which are disposed between the top portion () and the bottom portion () and allow penetration of the probe (), wherein the probe () is held in a curved state between the top portion () and the bottom portion (), the probe () buckles by contact of the distal end portion with an inspection object (), and at least a continuous portion of the probe (), which ranges from a portion where the probe () in a buckling state penetrates the bottom portion () to a portion where the probe () penetrates the lower guide portion (), is a high-rigidity portion () made to have higher rigidity than a buckling portion of the probe ().