The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2020
Filed:
Jun. 30, 2017
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
University of Arizona, Tucson, AZ (US);
Lambertus Hesselink, Atherton, CA (US);
Max Yuen, San Francisco, CA (US);
Yao-Te Cheng, New Taipei, TW;
Yuzuru Takashima, Cupertino, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Abstract
Single X-ray grating differential phase contrast (DPC) X-ray imaging is provided by replacing the conventional X-ray source with a photo-emitter X-ray source array (PeXSA), and by replacing the conventional X-ray detector with a photonic-channeled X-ray detector array (PcXDA). These substitutions allow for the elimination of the G0 and G2 amplitude X-ray gratings used in conventional DPC X-ray imaging. Equivalent spatial patterns are formed optically in the PeXSA and the PcXDA. The result is DPC imaging that only has a single X-ray grating (i.e., the G1 X-ray phase grating).