The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2020
Filed:
Mar. 15, 2017
Shimadzu Corporation, Kyoto, JP;
Koichi Tanabe, Kyoto, JP;
Toshinori Yoshimuta, Kyoto, JP;
Kenji Kimura, Kyoto, JP;
Hiroyuki Kishihara, Kyoto, JP;
Yukihisa Wada, Kyoto, JP;
Takuro Izumi, Kyoto, JP;
Taro Shirai, Kyoto, JP;
Takahiro Doki, Kyoto, JP;
Satoshi Sano, Kyoto, JP;
Akira Horiba, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
Provided is a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject. According to the present invention, it is possible to provide a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject immediately before. That is, the apparatus of the present invention is provided with a phase gratingprovided with a subject area and a reference area. Both areas each have a predetermined pattern that absorbs radiation, but the patterns are different from each other. In this area, an image of the phase gratingis observed in a moire pattern of a long period. This moire image of a long period changes in the positions due to the minute change in the relative position between the phase gratingand the absorption grating, so it becomes possible to detect the minute change of the relative position between the radiation source, the phase grating, and the absorption gratingfrom the image of the reference area.