The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2020
Filed:
Sep. 12, 2017
Diamond Innovations, Inc., Worthington, OH (US);
Camille Ellen Mayberry, Ellensburg, WA (US);
Emil Tinkov Stoyanov, Dublin, OH (US);
Kurt Dylan Leinenweber, Chandler, AZ (US);
Abds-Sami Malik, Westerville, OH (US);
DIAMOND INNOVATIONS, INC., Worthington, OH (US);
Abstract
A method for the measurement of temperature in high temperature and high pressure processes includes the steps of providing at least a first material compound and at least a second material compound. The at least first and second compounds are mixed to form a material sample. The material sample is loaded into a device and the device and material sample are subjected to a high pressure of up to about 10 GPa and a high temperature of up to about 1700° C. to form the material sample into a solid crystalline solution. The material sample is recovered for analysis and the composition of the crystalline solid solution is measured to determine the temperature.