The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2020
Filed:
Oct. 25, 2017
Lg Chem, Ltd., Seoul, KR;
Jeong Kyu Lee, Daejeon, KR;
Pum Suk Park, Daejeon, KR;
In Young Song, Daejeon, KR;
Sung Joon Oh, Daejeon, KR;
Yi Young Choi, Daejeon, KR;
Soon Ho Sun, Daejeon, KR;
LG CHEM, LTD., Seoul, KR;
Abstract
The present invention relates to an ethylene/alpha-olefin copolymer and, more particularly, to an ethylene/alpha-olefin copolymer that exhibits excellent environmental stress crack resistance by appropriately controlling the ratio of crystal structure domain and amorphous domain, and the like. The ethylene/alpha-olefin copolymer comprises an ethylene repeating unit and an alpha-olefin repeating unit, and has a crystal structure including a crystalline domain containing lamellar crystals and an amorphous domain containing a tie molecule that mediates bonding between the lamellar crystals. The lamellar crystal thickness (dc) of the ethylene/alpha-olefin copolymer as calculated from the result of Small Angle X-ray Scattering (SAXS) analysis is between 12.0 and 16.0 nm, the amorphous domain thickness (da) is between 4.0 and 5.3 nm, and the thickness ratio da/dc is between 0.3 and 0.4.