The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2020
Filed:
Aug. 13, 2018
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Utku Baran, Seattle, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
A micro-electro mechanical system (MEMS) scanner has a backside reinforcement structure configured to concentrate stress which is exerted against the reinforcement structure at contour points. The reinforcement structure is attached to an underside of a mirror to maintain mirror flatness. Characteristics and features of the contour points are variable based on the specific application, including considerations for the design of the MEMS scanner, mirror, and reinforcement structure. The contour points are configured for concentration of stress to relieve stress from relatively weaker areas on the reinforcement structure, thereby increasing reliability and performance of the MEMS scanner. For example, a point of failure on the reinforcement structure may be where a top silicon layer and transition layer (e.g., silicon oxide layer) adjoin. Implementation of the contour points can concentrate stress at the contour points and thereby relieve stress from the weaker areas.