The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Feb. 07, 2017
Applicant:

Hewlett-packard Development Company, L.p., Spring, TX (US);

Inventors:

Andy/Prima Kencana, Singapore, SG;

Peow Ng, Singapore, SG;

Kang Leng Tan, Singapore, SG;

Zixing Yao, Singapore, SG;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/38 (2006.01); B41J 2/21 (2006.01); B41J 29/393 (2006.01);
U.S. Cl.
CPC ...
B41J 2/2135 (2013.01); B41J 2/2146 (2013.01); B41J 29/393 (2013.01); B41J 2029/3935 (2013.01); B41J 2202/20 (2013.01);
Abstract

Examples relating to calibrating printing pens of a print bead assembly in a printer are described. For example, techniques for calibrating a printing pen includes detecting position of a first symbol and a second symbol of a pattern from amongst multiple patterns in an alignment pattern, where each pattern is associated with art ideal deviation and the symbols are printed in a juxtaposed position. The ideal deviation is a predefined value of deviation between the symbols when the printing pen is aligned. Thereafter, determining an actual deviation, due to misalignment in the printing pen, between the symbols. Further the technique includes establishing a relation between the actual deviation and the ideal deviation for the multiple patterns and determining a value of the ideal deviation for a zero value of the actual deviation. The value of the ideal deviation is a corrective value of alignment for the printing pen.


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