The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Mar. 06, 2018
Applicants:

Krishna Prasad Agara Venkatesha Rao, Bengaluru, IN;

Srinidhi Srinivasa, Bengaluru, IN;

Inventors:
Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/04 (2006.01); A61B 5/00 (2006.01); G06F 3/14 (2006.01);
U.S. Cl.
CPC ...
A61B 5/04012 (2013.01); A61B 5/726 (2013.01); A61B 5/7257 (2013.01); A61B 5/742 (2013.01); G06F 3/14 (2013.01);
Abstract

A system assists users in time and frequency analysis of magnetoencephalography (MEG) signals. In one aspect, a system includes an analysis module, a configuration module and a user interface. The analysis module performs a time and frequency analysis of the MEG signal, for example a short time Fourier transform (STFT) or a continuous wavelet transform (CWT) analysis. The analysis is parameterized by a parameter set that affects the time and frequency resolution of the analysis, for example window size and overlap size for STFT or center frequency and decay parameter for CWT. The configuration module automatically determines or assists the user to determine correct values for the parameter set.


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