The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2020
Filed:
Nov. 21, 2017
Continuse Biometrics Ltd., Tel Aviv, IL;
Zeev Zalevsky, Rosh HaAyin, IL;
Nisim Nisan Ozana, Rehovot, IL;
CONTINUSE BIOMETRICS LTD., Tel Aviv, IL;
Abstract
A system for monitoring parameters of an object is described. The system comprising: a monitoring unit configured for performing one or more monitoring sessions on an object and collecting data from an inspection region on the object over time and generating monitored data indicative of the inspected region, a stimulation unit configured and operable for applying at least one selected external stimulation field on the object during said one or more monitoring sessions, and a control unit configured for receiving the monitored data from the monitoring unit and determining one or more selected parameters. The stimulation unit is configured for providing said at least one selected external stimulation field directed toward said inspection region from two or more different directions. The control unit being configured for utilizing said monitored data in accordance with data on the two or more different directions of the stimulation field applied to the inspection region for determining one or more selected parameters of the object.