The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2020
Filed:
Aug. 27, 2019
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Hyoungjoo Lee, Gyeonggi-do, KR;
Taeyoon Kim, Gyeonggi-do, KR;
Byungwook Yoo, Gyeonggi-do, KR;
Chaeman Lim, Gyeonggi-do, KR;
Euichang Jung, Gyeonggi-do, KR;
Abstract
An electronic device is provided and includes a housing, an antenna module, a wireless communication circuit, a processor, and a memory. The memory stores a number of measurements and a threshold. The number of measurements is defined for measuring, by using a directional beam, a strength of a plurality of beams having different directions and generated by at least one external electronic device. The threshold is defined for changing a beam pair link for communication with the external electronic device. The memory stores instructions that cause, when executed, the processor to measure, based on the number of measurements, a strength of a first beam generated by a first external electronic device by using a first directional beam formed in a first direction through the antenna module, to measure, based on the number of measurements, a strength of a second beam generated by at least one of the first external electronic device or a second external electronic device by using a second directional beam formed in a second direction different from the first direction through the antenna module, and to adjust at least one of the stored number of measurements or the stored threshold based on at least the measured strengths of the first and second beams.