The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2020

Filed:

Jul. 24, 2019
Applicant:

The United States of America, As Represented BY the Secretary of the Navy, Crane, IN (US);

Inventors:

Matthew James Kay, Bloomington, IN (US);

Matthew John Gadladge, Bloomington, IN (US);

Adam Ray Duncan, Bloomington, IN (US);

Brett J. Hamilton, Heltonville, IN (US);

Andrew Mark Howard, Bloomington, IN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/177 (2020.01); H03K 19/1776 (2020.01); H03K 19/17728 (2020.01); G11C 11/16 (2006.01); H03K 19/17764 (2020.01); G11C 17/16 (2006.01); H03K 19/17768 (2020.01);
U.S. Cl.
CPC ...
H03K 19/1776 (2013.01); G11C 11/161 (2013.01); G11C 11/1673 (2013.01); G11C 11/1675 (2013.01); G11C 17/16 (2013.01); H03K 19/17728 (2013.01); H03K 19/17764 (2013.01); H03K 19/17768 (2013.01);
Abstract

Various embodiments include providing a MTJ-based LUT and adding a system that short circuits or causes dielectric layer breakdown of selected MTJ junctions to permanently finalize a desired logic state configuration of selected MTJs that is read out by the LUT. Additional embodiments disable dielectric layer breakdown or short circuit control circuits to prevent further alterations to MTJ that have not had their dielectric layers broken down or shorted out. A control system then alters reading out the MTJ-based LUT to sense original higher and lower resistance values of un-shorted/altered MTJs as a higher resistance state and a shorted or dielectric layer that has been broken down as a lower resistance state. This combines the flexibility of a multiple-time programmable LUT-based FPGA with the security and reliability of a one-time programmable LUT-based FPGA which has characteristics of a fixed logic non-programmable integrated circuit or application specific integrated circuit (ASIC).


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