The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10854734 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 01, 2020

Filed:

Jul. 24, 2019
Applicant:

Glc Semiconductor Group (Cq) Co., Ltd., Chongqing, CN;

Inventors:

Yi-Chun Shih, Nantou County, TW;

Shun-Min Yeh, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 29/00 (2006.01); H01L 29/66 (2006.01); H01L 29/417 (2006.01); H01L 29/08 (2006.01); H01L 29/40 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66712 (2013.01); H01L 21/02505 (2013.01); H01L 29/0882 (2013.01); H01L 29/401 (2013.01); H01L 29/41741 (2013.01); H01L 29/66522 (2013.01);
Abstract

A manufacturing method of a semiconductor device includes the following steps. A substrate is provided. The substrate has a first side and a second side opposite to the first side. A first III-V compound layer is formed at the first side of the substrate. A drain trench and a contact trench are formed at the second side of the substrate. The drain trench extends from the second side of the substrate toward the first side of the substrate and penetrates the substrate. The contact trench extends from the second side of the substrate toward the first side of the substrate and penetrates the substrate. The drain trench and the contact trench are formed concurrently by the same process. A drain electrode is formed in the drain trench. A back contact structure is formed in the contact trench.


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Shih, Yi-Chun. (2020). Manufacturing method of semiconductor device (U.S. Patent No. 10854734). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10854734

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