The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2020
Filed:
Feb. 09, 2016
10x Genomics, Inc., Pleasanton, CA (US);
Sofia Kyriazopoulou-Panagiotopoulou, Pleasanton, CA (US);
Patrick Marks, San Francisco, CA (US);
Michael Schnall-Levin, Pleasanton, CA (US);
Xinying Zheng, Pleasanton, CA (US);
Mirna Jarosz, Pleasanton, CA (US);
Serge Saxonov, Oakland, CA (US);
Kristina Giorda, San Mateo, CA (US);
Patrice Mudivarti, Berkeley, CA (US);
Heather Ordonez, Oakland, CA (US);
Jessica Terry, Pleasanton, CA (US);
William Haynes Heaton, Pleasanton, CA (US);
10X Genomics, Inc., Pleasanton, CA (US);
Abstract
Systems and methods for determining structural variation and phasing using variant call data obtained from nucleic acid of a biological sample are provided. Sequence reads are obtained, each comprising a portion corresponding to a subset of the test nucleic acid and a portion encoding a barcode independent of the sequencing data. Bin information is obtained. Each bin represents a different portion of the sample nucleic acid. Each bin corresponds to a set of sequence reads in a plurality of sets of sequence reads formed from the sequence reads such that each sequence read in a respective set of sequence reads corresponds to a subset of the nucleic acid represented by the bin corresponding to the respective set. Binomial tests identify bin pairs having more sequence reads with the same barcode in common than expected by chance. Probabilistic models determine structural variation likelihood from the sequence reads of these bin pairs.