The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2020

Filed:

Aug. 03, 2018
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Hasnain Shabbir, Round Rock, TX (US);

Vadhiraj Sankaranarayanan, Austin, TX (US);

Amit Sumanlal Shah, Austin, TX (US);

Mark Andrew Dykstra, Round Rock, TX (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G11C 5/04 (2006.01); G06F 1/20 (2006.01); G06F 11/30 (2006.01); G06F 11/07 (2006.01); G11C 11/4078 (2006.01);
U.S. Cl.
CPC ...
G11C 5/04 (2013.01); G06F 1/206 (2013.01); G06F 11/0727 (2013.01); G06F 11/3058 (2013.01); G11C 11/4078 (2013.01);
Abstract

A dual in-line memory module (DIMM) thermal control system for intelligent DIMM thermal controls for maximum uptime may include a memory subsystem. The memory subsystem may include a first DIMM and a first serial presence detect (SPD) module associated with the first DIMM. The DIMM thermal control system may also include a baseboard management controller (BMC). The BMC may, when a first DIMM failure of the first DIMM may be detected, record a first failure event in a first failure events log of the first SPD module. The first failure event may comprise the first DIMM failure and associated first thermal telemetry data of the first DIMM. The BMC may also adjust DIMM thermal control settings to reduce temperature of the first DIMM based on the first failure events log including at least the first failure event.


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