The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2020

Filed:

Jul. 17, 2018
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Eiki Ozawa, Minami-ashigara, JP;

Norihito Kasada, Minami-ashigara, JP;

Toshio Tada, Minami-ashigara, JP;

Takuto Kurokawa, Minami-ashigara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/735 (2006.01); G11B 5/78 (2006.01); G11B 5/706 (2006.01); G11B 5/708 (2006.01); G11B 5/71 (2006.01); G11B 5/84 (2006.01); G11B 5/714 (2006.01); G11B 5/712 (2006.01);
U.S. Cl.
CPC ...
G11B 5/712 (2013.01); G11B 5/7085 (2013.01); G11B 5/70678 (2013.01); G11B 5/71 (2013.01); G11B 5/714 (2013.01); G11B 5/735 (2013.01); G11B 5/78 (2013.01); G11B 5/84 (2013.01);
Abstract

The magnetic recording medium includes a magnetic layer which contains ferromagnetic hexagonal ferrite powder and a binder, in which the magnetic layer contains an abrasive and a fatty acid ester, Int (110)/Int (114) of a crystal structure of the hexagonal ferrite, determined by performing XRD analysis on the magnetic layer by using an In-Plane method, is equal to or higher than 0.5 and equal to or lower than 4.0, a squareness ratio of the magnetic recording medium in a vertical direction is equal to or higher than 0.65 and equal to or lower than 1.00, FWHMand FWHMis greater than 0 nm and equal to or smaller than 7.0 nm, and a difference between spacings measured within a surface of the magnetic layer by an optical interference method before and after the heating in a vacuum is greater than 0 nm and equal to or smaller than 8.0 nm.


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