The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2020

Filed:

Jul. 18, 2018
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Eiki Ozawa, Minami-ashigara, JP;

Toshio Tada, Minami-ashigara, JP;

Norihito Kasada, Minami-ashigara, JP;

Takuto Kurokawa, Minami-ashigara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/706 (2006.01); G11B 5/78 (2006.01); G11B 5/71 (2006.01); G11B 5/712 (2006.01); G11B 5/84 (2006.01); G11B 5/708 (2006.01); G11B 5/714 (2006.01);
U.S. Cl.
CPC ...
G11B 5/70678 (2013.01); G11B 5/7085 (2013.01); G11B 5/71 (2013.01); G11B 5/712 (2013.01); G11B 5/714 (2013.01); G11B 5/78 (2013.01); G11B 5/84 (2013.01);
Abstract

Provided is a magnetic tape in which an Ra measured regarding a surface of a magnetic layer is equal to or smaller than 1.8 nm, Int(110)/Int(114) of a hexagonal ferrite crystal structure obtained by an XRD analysis of the magnetic layer by using an In-Plane method is 0.5 to 4.0, a vertical squareness ratio of the magnetic tape is 0.65 to 1.00, full widths at half maximum of spacing distribution measured by optical interferometry regarding the surface of the back coating layer before and after performing a vacuum heating with respect to the magnetic tape are greater than 0 nm and equal to or smaller than 10.0 nm, and a difference between the spacings measured by optical interferometry regarding the surface of the back coating layer before and after performing the vacuum heating is greater than 0 nm and equal to or smaller than 8.0 nm.


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