The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2020
Filed:
Dec. 21, 2018
Magic Leap, Inc., Plantation, FL (US);
Yu-Tseh Chi, Cupertino, CA (US);
Jean-Yves Bouguet, Palo Alto, CA (US);
Divya Sharma, San Jose, CA (US);
Lei Huang, Fremont, CA (US);
Dennis William Strelow, San Jose, CA (US);
Etienne Gregoire Grossmann, Menlo Park, CA (US);
Evan Gregory Levine, Mountain View, CA (US);
Adam Harmat, Sunnyvale, CA (US);
Ashwin Swaminathan, Dublin, CA (US);
Magic Leap, Inc., Plantation, FL (US);
Abstract
A method for calibrating a device having a first sensor and a second sensor. The method includes capturing sensor data using the first sensor and the second sensor. The device maintains a calibration profile including a translation parameter and a rotation parameter to model a spatial relationship between the first sensor and the second sensor. The method also includes determining a calibration level associated with the calibration profile at a first time. The method further includes determining, based on the calibration level, to perform a calibration process. The method further includes performing the calibration process at the first time by generating one or both of a calibrated translation parameter and a calibrated rotation parameter and replacing one or both of the translation parameter and the rotation parameter with one or both of the calibrated translation parameter and the calibrated rotation parameter.