The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2020
Filed:
Mar. 09, 2019
Ventana 3d, Llc, Van Nuys, CA (US);
Michael James Borke, Santa Clara, CA (US);
Hayk Bezirganyan, Burbank, CA (US);
Ashley Crowder, Culver City, CA (US);
Benjamin Conway, Anaheim Hills, CA (US);
VENTANA 3D, LLC, Santa Clara, CA (US);
Abstract
Various techniques are described herein that provide for real-time quality control during manufacturing using augmented reality. In particular, in one embodiment, techniques herein project a three-dimensional (3D) virtual shape/model onto a work-in-progress part in the real-world in order to see defects in real-time, thus allowing for mid-manufacturing corrections. The embodiments herein generally consist of first calibrating a 'virtual world' to the real world, then calibrating the physical product to the virtual world, and lastly projecting information onto the physical product, such as various design information and/or quality control information.