The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2020
Filed:
Feb. 07, 2017
Samsung Electronics Co., Ltd., Suwon-si, KR;
Sung-do Choi, Suwon-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
Provided is a method of acquiring depth information of an object including acquiring first depth information of the object located at a first point in a common sensing region common to respective sensing regions of a plurality of sensors and first shape information of at least one view point, acquiring second shape information of the object at a second point when the object is located at the second point in a region excluding the common sensing region on the respective sensing regions of the plurality of sensors, and acquiring second depth information of the object at the second point based on a result of comparison between the first shape information of the at least one view point and the second shape information and the first depth information.