The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2020
Filed:
Apr. 02, 2018
Cloudera, Inc., Palo Alto, CA (US);
Alexander Behm, Lafayette, CA (US);
Mostafa Mokhtar, San Francisco, CA (US);
Cloudera, Inc., Palo Alto, CA (US);
Abstract
The problem of distinct value estimation has many applications, but is particularly important in the field of database technology where such information is utilized by query planners to generate and optimize query plans. Introduced is a novel technique for estimating the number of distinct values in a given dataset without scanning all of the values in the dataset. In an example embodiment, the introduced technique includes gathering multiple intermediate probabilistic estimates based on varying samples of the dataset, 2) plotting the multiple intermediate probabilistic estimates against indications of sample size, 3) fitting a function to the plotted data points, and 4) determining an overall distinct value estimate by extrapolating the objective function to an estimated or known total number of values in the dataset.