The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2020

Filed:

May. 22, 2017
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Josef Alois Birchbauer, Seiersberg, AT;

Michael Hornacek, Vienna, AT;

Daniel Schall, Vienna, AT;

Dietmar Schmidt, Vienna, AT;

Paul Schneeweiss, Vienna, AT;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41875 (2013.01); G05B 19/41895 (2013.01); G05B 23/0216 (2013.01); G05B 2219/32404 (2013.01); Y02P 90/285 (2015.11); Y02P 90/60 (2015.11);
Abstract

A method for visualizing and validating process events in process monitoring systems, wherein a permanently installed sensor system reports states to a process monitoring system, if predefined limit values are exceeded, then the process monitoring system initiates, plans and performs local data acquisition using a mobile sensor, where the result of this data acquisition is analyzed and visualized in the process monitoring system and is integrated in the state information relating to the process or the installation.


Find Patent Forward Citations

Birchbauer, Josef. (2020). System and method for visualizing and validating process events (U.S. Patent No. 10852715). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10852715

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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