The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2020

Filed:

Jun. 27, 2018
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Masahiro Saeki, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/404 (2006.01); G06N 3/08 (2006.01); G05B 13/02 (2006.01);
U.S. Cl.
CPC ...
G05B 19/404 (2013.01); G05B 13/027 (2013.01); G05B 2219/32335 (2013.01); G05B 2219/33034 (2013.01); G05B 2219/49207 (2013.01); G06N 3/08 (2013.01);
Abstract

A thermal displacement compensation apparatus for compensating a dimensional measurement error due to a thermal displacement of a workpiece, including a machine learning device for learning shape measurement data at the time of inspection of the workpiece, wherein the machine learning device observes image data showing the temperature distribution of the workpiece and shape data after machining as state variables representing the current state of the environment, acquires judgment data indicating the shape measurement data at the time of inspection, and learns the image data showing the temperature distribution of the workpiece and shape data after machining and the shape measurement data at the time of inspection in association with each other using the observed state variables and the acquired judgment data.


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