The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2020
Filed:
May. 05, 2014
Liebert Corporation, Columbus, OH (US);
Steven Geffin, Miami, FL (US);
Gregory W. Ratcliff, Delaware, OH (US);
Edward W. Deveau, Pompano Beach, FL (US);
Vertiv Corporation, Columbus, OH (US);
Abstract
A system and method is disclosed for analyzing a set of collected raw data point values and determining which one or ones of the values are erroneous data values. In one implementation of the method specific ones of the values are examined to determine if they are outliers, and if so they are removed from the data set. At least two other ones of the values obtained at points in time prior to a given one of the values are examined. Weights may be assigned to the at least two other values, and the weights used to help generate a predicted data point value. The predicted data point value is compared to the given one of the values to determine if the given one of the values is an erroneous value. In this way the integrity of each data point value in the set can be checked.