The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2020
Filed:
May. 30, 2019
International Business Machines Corporation, Armonk, NY (US);
Tong Li, Austin, TX (US);
David Winston, Asheville, NC (US);
Pravin Kamdar, Leander, TX (US);
Richard Daniel Kimmel, Wappingers Falls, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Systems and methods of developing an integrated circuit implement selecting a desired yield for a circuit used in the integrated circuit. The desired yield corresponds to a desired failure probability of the circuit. The method includes determining a parameter threshold value that corresponds with the desired yield. The circuit passes if a parameter associated with the circuit is below the parameter threshold value and the desired yield indicates a percentage of instances of the circuit that pass according to the parameter threshold value. The method also includes using the parameter threshold value that corresponds with the desired yield during testing and improvement of a design of the integrated circuit, and providing the design of the integrated circuit for fabrication.