The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2020

Filed:

Nov. 07, 2014
Applicant:

Espec Corp., Osaka, JP;

Inventor:

Hideki Tanaka, Kobe, JP;

Assignee:

ESPEC CORP., Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H05B 3/22 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2874 (2013.01); G01R 31/003 (2013.01); H05B 3/22 (2013.01); G01R 31/2875 (2013.01);
Abstract

A contact-type testing device that has a heating plate capable of being heated and in which a desired test is conducted while a test object is in contact with the heating plate, the contact-type testing device including: a heating member that heats the heating plate, wherein the heating member includes: a plurality of strips of heat generation bodies; and a power feeding section that feeds electricity to the heat generation bodies, wherein the heat generation bodies are distributed in a planar manner, and a group or all of the heat generation bodies are parallel-connected, wherein a part or all of the heat generation bodies have a steep temperature/resistance characteristic, and resistance values of the heat generation bodies increase with temperature, and wherein the heating member is disposed to face the heating plate, and a gap is provided between the heating plate and the heating member.


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