The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2020

Filed:

Nov. 20, 2018
Applicant:

GM Global Technology Operations Llc, Detroit, MI (US);

Inventors:

Xinyu Du, Oakland Township, MI (US);

Wen-Chiao Lin, Rochester Hills, MI (US);

Yilu Zhang, Northville, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); B60L 3/00 (2019.01); G01R 31/3842 (2019.01); G01R 31/66 (2020.01); G08B 25/00 (2006.01); G08B 21/18 (2006.01);
U.S. Cl.
CPC ...
G01R 31/007 (2013.01); B60L 3/0069 (2013.01); B60L 3/0084 (2013.01); G01R 31/3842 (2019.01); G01R 31/66 (2020.01); G08B 21/182 (2013.01); G08B 25/00 (2013.01);
Abstract

A vehicle electronics high-resistance fault diagnosis system is provided, as well as a method of detecting and isolating a high-resistance fault in vehicle electronics of a vehicle. The method includes the steps of determining electrical data for one or more portions of the vehicle electronics, wherein the electrical data includes voltage data and/or current data concerning the one or more portions of the vehicle electronics; calculating a resistance for a plurality of resistance sets of the vehicle electronics based on the electrical data, wherein each of the plurality of resistance sets includes one or more electrical components; obtaining a resistance set threshold for each of the plurality of resistance sets of the vehicle electronics; for each of the plurality of resistance sets, evaluating whether the resistance of the resistance set exceeds the resistance set threshold; and based on the evaluating step, identifying one or more high-resistance fault candidates.


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