The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2020

Filed:

Dec. 07, 2018
Applicant:

Signal Microwave, Llc, Chandler, AZ (US);

Inventors:

William Rosas, Chandler, AZ (US);

Eric Gebhard, Scottsdale, AZ (US);

Brian Shumaker, San Carlos, CA (US);

Assignee:

SIGNAL MICROWAVE, LLC, Chandler, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); G01R 31/28 (2006.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07392 (2013.01); G01R 1/06755 (2013.01); G01R 1/06772 (2013.01); G01R 1/07342 (2013.01); G01R 31/2886 (2013.01);
Abstract

A high-frequency testing probe having a probe substrate and at least two probe tips. The probe substrate is a printed circuit board and the probe tips are coupled to and extend outward from the printed circuit board. The first and second probe tips are each communicatively coupled to respective first and second probe connectors through respective first and second conducting traces disposed upon the printed circuit board. The probe connectors are configured to couple the testing probe to at least one of a high-frequency vector network analyzer and a high-frequency time domain reflectometer. The probe tips translate along their respective central longitudinal axes through respective adjustable couplings to modify respective distances the probe tips extend outward from the printed circuit board.


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